The Bruker Contour GT-K

The Bruker Contour GT-K Interference microscope

The Bruker Contour GT-K is a very high-resolution white light interference microscope. With sub-nanometer vertical resolution and a large measuring range, it is ideal for surface metrology. The analysis software makes it possible to obtain high-precision 2D and 3D scans and to extract the characteristics of the analyzed samples.

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